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Imaging silicon defects using Raman and PL multivariate imaging

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.

Florida python hunters rake in cash for eliminating invasive snakes

The South Florida Water Management District is in its second year of managing a Python Removal Program. Winners win cash ...
Worthplaying

NVIDIA Will Roll Out DLSS 4.5 End Of This Month, Reveals 20 DLSS 4.5 Titles, New RTX Remix, GeForce NOW, RTX AI PC Updates And More

NVIDIA announced DLSS 4.5 will be available March 31th, 20 new DLSS 4.5 and Path-Traced games are coming, RTX Remix update will introduce Advanced Particle VFX, new GeForce Game Ready Driver, RTX Mega ...
eLife

Pupil size reveals the perceptual quality and effortless nature of synesthesia

This study used pupillometry to provide an objective assessment of a form of synesthesia in which people see additional color when reading numbers. It provides convincing evidence that subjective ...