In advanced semiconductor manufacturing, inspection and FA are not overhead—they are economic control mechanisms that protect ...

Neural electrodes coated with a heparan sulfate mimetic show improved electrical performance and reduced tissue reactivity, enhancing implant longevity.

FTIR spectroscopy with chemometric modeling provides a rapid, non-destructive estimation of the aniline point.

Portable balancing systems enable faster on-wing corrections, minimizing shop visits and easing maintenance bottlenecks.

FTIR microscopy is a robust analytical method used to identify contaminants at specific locations within a sample. By using visual imaging to pinpoint the exact location of contamination, an infrared ...

NIRS allows for the rapid, chemical-free measurement of fat, protein, sugars, total solids, and calories to support ...

Yield loss from contamination demands more than detection. Learn how integrated inspection, materials analysis, and process correlation establish defensible root cause in semiconductor fabs.

Near-infrared spectroscopy allows for the continuous detection of wheat flour adulteration, helping protect food safety, ...

Portable particle size analysis offers quick, reliable measurement of particle populations to support process control.

Learn how NIRS allows for the rapid measurement of caffeine and moisture in roasted coffee beans, helping roasters optimize ...

Today's oil and gas engineers are innovating with materials and surface technologies to enhance equipment reliability and ...

A research team led by Professor Lu Jian, Dean of the College of Engineering and Chair Professor in the Department of ...